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Numerical and measurement based modeling of a MiM capacitor in a 0.25 µm SiGe-C BiCMOS process
(Electromagnetics Academy, 2023)This study presents the generation of a scalable model based on measurement-aided numerical calculations for MiMCap (Metal-Insulator-Metal Capacitor) structures with a 0.25 µm SiGe-C BiCMOS technology. Various MiM capacitor ...